Inverse Problems
Author:
Publisher
Springer International Publishing
Link
http://link.springer.com/content/pdf/10.1007/978-3-319-23627-8_11
Reference18 articles.
1. Aspnes DE (1976) Spectroscopic ellipsometry of solids. In: Seraphin BO (ed) Optical properties of solids: new developments. North Holland, Amsterdam (Chapter 15)
2. Azzam RMA (1979) Direct relation between Fresnel’s interface reflection coefficients for the parallel and perpendicular polarisations. J Opt Soc Am 69:1007–1016
3. Azzam RMA (1983) Ellipsometry of unsupported and embedded thin films. J de Phys C 10:67–70
4. Gelfand IM, Levitan BM (1951/1955) On the determination of a differential equation by its spectral function. Am Math Soc Tran (Ser. 2) 1:253–304
5. Hirsch J (1979) An analytic solution to the synthesis problem for dielectric thin-film layers. Optica. Acta 26:1273–1279
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