Publisher
Springer International Publishing
Cited by
11 articles.
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1. Examining the role of tap cell in suppressing single event transient effect in 28-nm CMOS technology;Microelectronics Journal;2024-01
2. Probability Formulation of Soft Error in Memory Circuit;Pertanika Journal of Science and Technology;2023-06-13
3. Prerequisites on Fault Diagnosis;Machine Learning Support for Fault Diagnosis of System-on-Chip;2023
4. Impact of Tap Cell on Single Event Transient in 28-nm CMOS Technology;2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS);2022-10-03
5. Improving Soft Error Robustness of Full Adder Circuits with Decoupling Cell and Transistor Sizing;2022 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design (SBCCI);2022-08-22