Measurement of Variation of Minority Carrier Lifetime in 8 MeV Electron Irradiated c-Si Solar Cells Using RRT Method-Reference-Cited by-同舟云学术

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Measurement of Variation of Minority Carrier Lifetime in 8 MeV Electron Irradiated c-Si Solar Cells Using RRT Method

Published:2014 Issue: Volume: Page:371-373
ISSN:1863-5520
Container-title:Physics of Semiconductor Devices
language:
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Author:

P Sathyanarayana Bhat,Rao Asha,Krishnan Sheeja,Sanjeev Ganesh,Puthanveettil Suresh E.

Publisher

Springer International Publishing

Link

http://link.springer.com/content/pdf/10.1007/978-3-319-03002-9_93

Reference10 articles.

1. W.C. Cooley and R.J. Janda, Hand book of space radiation effects on solar cell power systems. NASA/N63-20315 (1963).

2. M.Z. Rahman, International Journal of Renewable Energy Research, 2(1), 117-122 (2012).

3. J. A. Giesecke, B. Michl, F.Schindler, M. C. Schubert and W. Warta, Solar Energy Mater. Solar Cells. 95(7) 1979–1982 (2011).

4. S. Daliento, L. Mele, L. Lancelotti, P. Morvillo, E. Bobeico, F. Roca, L. Pirozzi, Performances characterization of concentration solar cells by means of I-V and lifetime measurements made with the QSSPC technique, 21st European Photovoltaic Solar Energy Conference and Exhibition (2006).

5. D.K. Schroder, Semiconductor Materials and Device Characterization, John Wiley, New York, (1990) pp.394.

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