Laser Assisted Surface Photovoltage Spectroscopy: A New Tool for an Accurate Determination of the Bandgap of Semiconductor Epitaxial Layers-Reference-Cited by-同舟云学术

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Laser Assisted Surface Photovoltage Spectroscopy: A New Tool for an Accurate Determination of the Bandgap of Semiconductor Epitaxial Layers

Published:2014 Issue: Volume: Page:787-789
ISSN:1863-5520
Container-title:Physics of Semiconductor Devices
language:
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Author:

Jana Dipankar,Porwal S.,Sharma T. K.,Kumar Shailendra,Oak S. M.

Publisher

Springer International Publishing

Link

http://link.springer.com/content/pdf/10.1007/978-3-319-03002-9_202

Reference10 articles.

1. L. Kronik and Y Shapira, Surf. Sci. Rep. 37, 1 (1999).

2. T. K. Sharma, S. Porwal, R. Kumar and S. Kumar, Rev. Sci. Instrum. 73, 1835 (2002).

3. L. Kronik, L. Burstein and Y. Shapira, Appl. Phys. Lett. 63, 60 (1993).

4. T. K. Sharma, S. Kumar, Appl. Phys. Lett. 79, 1715 (2001).

5. T. K. Sharma, S. Kumar and K. C. Rustagi, J. Appl. Phys. 92, 5959 (2002).

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Pump-probe surface photovoltage spectroscopy measurements on semiconductor epitaxial layers;Review of Scientific Instruments;2014-04

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