Author:
Zhuang Yuming,Chen Degang
Publisher
Springer International Publishing
Reference15 articles.
1. Y. Zhuang, D. Chen, Accurate Spectral Testing with Impure Source Test Stimulus for Multi-tone Test, submitted to IEEE VLSI Test Symp. (VTS), (2018)
2. M. Burns, G.W. Roberts, An Introduction to Mixed-Signal IC Test and Measurement (Oxford University Press, New York, 2012)
3. J. Doernberg, H.-S. Lee, D.A. Hodges, Full-speed testing of A/D converters. IEEE J. Solid State Circuits SC-19, 820–827 (1984)
4. M. Mahoney, DSP-Based Testing of Analog and Mixed-Signal Circuits (Wiley-IEEE Computer Society Press, Washington, DC, USA, 1987)
5. Y. Zhuang, D. Chen, New strategies in removing noncoherency from signals with large distortion-to-noise ratios, Accepted by IEEE Trans. Circuits Syst. II, Exp. Briefs, (2017)