1. L.M. Barker, Measurement of Free Surface Motion by the Slanted Resistor Technology. Sandia National Laboratories Report SC-DR-610078 (Sandia National Laborator, Albuquerque, NM, 1961)
2. L.M. Barker, Determination of Shock Wave and Particle Velocities from Slanted Resistor Data. Sandia National Laboratories Report SC004611 (RR) (Sandia National Laboratory, Albuquerque, NM, 1962)
3. L.M. Barker, R.E. Hollenbach, System for measuring the dynamic properties of materials. Rev. Sci. Instrum. 35, 742–746 (1964)
4. L.M. Barker, R.E. Hollenbach, Interferometer technique for measuring the dynamic mechanical properties of materials. Rev. Sci. Instrum. 36(11), 1617–1620 (1965)
5. L.M. Barker, Fine structure of compressive and release wave shapes in aluminum measured by the velocity interferometer technique, in Behavior of Dense Media Under High Dynamic Pressures, Proceedings of IUTAM Symposium on the Behavior of Dense Media Under High Dynamic Pressures, Paris, France, September 11–16, 1967, ed. by J. Berger (Gordon and Breach, New York, NY, 1968), pp. 483–504