BINARM: Scalable and Efficient Detection of Vulnerabilities in Firmware Images of Intelligent Electronic Devices-Reference-Cited by-同舟云学术

BINARM: Scalable and Efficient Detection of Vulnerabilities in Firmware Images of Intelligent Electronic Devices

Published:2018 Issue: Volume: Page:114-138
ISSN:0302-9743
Container-title:Detection of Intrusions and Malware, and Vulnerability Assessment
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Author:

Shirani Paria,Collard Leo,Agba Basile L.,Lebel Bernard,Debbabi Mourad,Wang Lingyu,Hanna Aiman

Publisher

Springer International Publishing

Link

Reference58 articles.

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3. NIST/SEMATECH e-Handbook of Statistical Methods (2015). http://www.itl.nist.gov/div898/handbook/

4. ARM Instruction Reference (2017). http://infocenter.arm.com/help/index.jsp?topic=/com.arm.doc.dui0068b/CIHEDHIF.html

5. Common Vulnerabilities and Exposures (2017). https://nvd.nist.gov/

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2. CEBin: A Cost-Effective Framework for Large-Scale Binary Code Similarity Detection;Proceedings of the 33rd ACM SIGSOFT International Symposium on Software Testing and Analysis;2024-09-11