Characterization Techniques and Challenges with Porous Silicon
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Publisher
Springer International Publishing
Link
http://link.springer.com/content/pdf/10.1007/978-3-319-04508-5_40-3
Reference39 articles.
1. Axelrod E, Givant A, Shappir J, Feldman Y, Saar A (2002) Dielectric relaxation and transport in porous silicon. Phys Rev B 65:165–429
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3. Ben-Chorin M, Moller F, Koch F, Schirmacher W, Eberhard M (1995) Hopping transport on a fractal: ac conductivity of porous silicon. Phys Rev B 51(4):2199–2213
4. Bisi O, Ossicini S, Pavesi L (2000) Porous silicon: a quantum sponge structure for silicon based optoelectronics. Surf Sci Rep 38(1–3):1–126
5. Boarino L, Borini S, Amato G (2009) Electrical properties of mesoporous silicon: from a surface effect to coulomb blockade and more. J Electrochem Soc 156(12):K223–K226
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