Raman Spectroscopy of Porous Silicon
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Publisher
Springer International Publishing
Link
http://link.springer.com/content/pdf/10.1007/978-3-319-04508-5_120-1
Reference60 articles.
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5. Englert T, Abstreiter G, Pontcharra J (1980) Determination of existing stress in silicon films on sapphire substrate using Raman spectroscopy. Solid State Electron 23:31–33. doi:10.1016/0038-1101(80)90164-1
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