On Generating Test Cases from EDT Specifications
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Publisher
Springer International Publishing
Link
http://link.springer.com/content/pdf/10.1007/978-3-319-30243-0_1
Reference32 articles.
1. Venkatesh, R., Shrotri, U., Zare, A., Agrawal, S.: Cost-effective functional testing of reactive software. In: Evaluation of Novel Approaches to Software Engineering. SCITEPRESS (2015)
2. Venkatesh, R., Shrotri, U., Krishna, G.M., Agrawal, S.: EDT: a specification notation for reactive systems. In: Proceedings of the Conference on Design, Automation&Test in Europe, p. 215.European Design and Automation Association (2014)
3. Anand, S., Burke, E.K., Chen, T.Y., Clark, J., Cohen, M.B., Grieskamp, W., Harman, M., Harrold, M.J., Mcminn, P.: An orchestrated survey of methodologies for automated software test case generation. J. Syst. Softw. 86, 1978–2001 (2013)
4. Lecture Notes in Computer Science;A Arcuri,2010
5. Dalal, S.R., Jain, A., Karunanithi, N., Leaton, J., Lott, C.M., Patton, G.C., Horowitz, B.M.: Model-based testing in practice. In: Proceedings of the 21st International Conference on Software Engineering, pp. 285–294. ACM (1999)
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