Author:
Zhao Junlong,Zhang Ying,Niu Lu
Publisher
Springer International Publishing
Reference18 articles.
1. Cook, R.D.: Detection of influential observation in linear regression. Technometrics 19, 15–18 (1977)
2. Behnken, D.W., Draper, N.R.: Residuals and their variance patterns. Technometrics 14, 101–111 (1972)
3. Belsley, D.A., Kuh, E., Welsch, R.E.: The Grid: Regression Diagnostics: Identifying Influential Data and Sources of Collinearity. Wiley, New York (2005)
4. Chatterjee, S., Hadi, A.S.: The Grid: Sensitivity Analysis in Linear Regression. Wiley, New York (1988)
5. Pena, D.: A new statistic for influence in linear regression. Technometrics 47(1), 1–12 (2005)