Author:
Petrenko Alexandre,Timo Omer Nguena,Ramesh S.
Publisher
Springer International Publishing
Reference23 articles.
1. Pomeranz, I., Sudhakar, M.R.: Test generation for multiple state-table faults in finite-state machines. IEEE Trans. Comput. 46(7), 783–794 (1997)
2. Poage, J.F., McCluskey, Jr., E.J.: Derivation of optimal test sequences for sequential machines. In: Proceedings of the IEEE 5th Symposium on Switching Circuits Theory and Logical Design, pp. 121–132 (1964)
3. DeMilli, R.A., Offutt, J.A.: Constraint-based automatic test data generation. IEEE Trans. Softw. Eng. 17(9), 900–910 (1991)
4. Grunsky, I.S., Petrenko, A.: Design of checking experiments with automata describing protocols. Automatic Control and Computer Sciences. Allerton Press Inc. USA. No. 4 (1988)
5. Hennie, F.C.: Fault detecting experiments for sequential circuits. In: Proceedings of the IEEE 5th Annual Symposium on Switching Circuits Theory and Logical Design. Princeton, pp. 95–110 (1964)
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