Author:
Girish H.,Shashikumar D. R.
Publisher
Springer International Publishing
Reference30 articles.
1. Reis, R., Cao, Y., Wirth, G.: Circuit Design for Reliability. Springer, New York (2014)
2. Han, W., Wang, Z.M.: Toward Quantum FinFET. Springer Science & Business Media, Switzerland (2013)
3. Shin, C.: Variation-Aware Advanced CMOS Devices and SRAM. Springer, Dordrecht (2016)
4. Prince, B.: Vertical 3D Memory Technologies. Wiley (2014)
5. Girish, H., Shashikumar, D.R.: Insights of performance enhancement techniques on FinFET-based SRAM cells. Commun. Appl. Electr. (CAE) 5(6), 20–26 (2016). Foundation of Computer Science
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献