Author:
Bhushan Bharat,Eminent Ohio,Winbigler Howard D.
Publisher
Springer International Publishing
Reference157 articles.
1. Amelio S, Goldade AV, Rabe U, Scherer V, Bhushan B, Arnold W (2001) Measurements of elastic properties of ultra-thin diamond-like carbon coatings using atomic force acoustic microscopy. Thin Solid Films 392:75–84
2. Anczykowski B, Kruger D, Babcock KL, Fuchs H (1996) Basic properties of dynamic force microscopy with the scanning force microscope in experiment and simulation. Ultramicroscopy 66:251–259
3. Anonymous (1959) The industrial graphite engineering handbook, National Carbon Company, New York
4. Anonymous (2002) Properties of silicon, EMIS data reviews series no. 4. INSPEC, Institution of Electrical Engineers, London. See also Anonymous, MEMS Materials Database, http://www.memsnet.org/material/
5. Avila A, Bhushan B (2010) Electrical measurement techniques in atomic force microscopy, (invited). Crit Rev Solid State Mater Sci 35:38–51