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Springer International Publishing
Reference15 articles.
1. Goldstein J, Lyman CE, Newbury DE, Lifshin E, Echlin P, Sawyer L, Joy DC, Michael JR (2003) Scanning electron microscopy and X-Ray microanalysis, 3rd edn. Springer Science + Business Media, Inc., New York, USA
2. Duane W, Hunt FL (1915) On x-ray wavelengths. Phys Rev 6:166
3. Kramers HA (1923) On the theory of x-ray absorption and of the continuous X-ray spectrum. Phil Mag 46:836.
https://doi.org/10.1080/14786442308565244
4. Bell DC, Erdman N (2013) Introduction to the theory and advantages of low voltage Electron microscopy. In: Bell DC, Erdman N (eds) Low voltage electron microscopy: principles and applications. Wiley, UK
5. Green M, Cosslet VE (1961) The efficiency of production of characteristics x-radiation in thick targets by a pure element. Proc Phys Soc 78:1206
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