Time-to-Failure Modeling-Reference-Cited by-同舟云学术

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Time-to-Failure Modeling

Published:2013 Issue: Volume: Page:37-49
ISSN:
Container-title:Reliability Physics and Engineering
language:
Short-container-title:

Author:

McPherson J. W.

Publisher

Springer International Publishing

Link

http://link.springer.com/content/pdf/10.1007/978-3-319-00122-7_4

Reference2 articles.

1. McPherson, J.: Stress Dependent Activation Energy, IEEE International Reliability Physics Symposium Proceedings, 12(1986).

2. McPherson, J. and E. Ogawa: Reliability Physics and Engineering. In: Handbook of Semiconductor Manufacturing Technology, 2 nd Edition, CRC Press 30-1(2008).

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