Author:
Baeri P.,Reitano R.,Malvezzi M. A.,Sirtori C.
Publisher
Springer Science and Business Media LLC
Reference19 articles.
1. See, for example, as a review paper, P. S. Peercy, M. O. Thompson, and J. Y. Tsao, in Beam Solid Interaction and Transient Process, Material Research Society Symposium Proceedings, Vol. 74, M. O. Thompson and J. S. Williams, eds. (MRS, Pittsburgh, 1987), p. 15.
2. J. M. Poate, Nucl. Instmm. Methods 209?210:211 (1983).
3. P. Baeri, G. Foti, J. M. Poate, and A. G. Cullis, Phys. Rev. Lett. 45:2036 (1980).
4. A. G. Cullis, H. C. Webber, N. G. Chew, J. M. Poate, and P. Baeri, Phys. Rev. Lett. 49:219 (1982).
5. M. von Allmen and S. S. Lau, in Laser Annealing of Semiconductors, J. M. Poate and J. M. Mayer, eds. (Academic, New York, 1982), p. 439.