1. V. V. Batavin, Yu. A. Kontsevoi, and Yu. V. Fedorovich, Measurement of the Parameters of Semiconductor Materials and Structures [in Russian], Radio i Svyaz', Moscow (1985).
2. D. N. Bilenko et al., Mikroelektronika,3, No. 4, 341 (1974).
3. D. I. Bilenko et al., Izv. Vyssh. Uchebn. Zaved., Fiz., No. 3, 97 (1972).
4. R. O. De Nicola, M. A. Saifi, and R. E. Frazee, Appl. Opt.,11, No. 11, 2534 (1972).
5. P. J. Severin, Appl. Opt.,9, No. 10, 2381 (1970).