Organic surface analysis with time-of-flight SIMS-Reference-Cited by-同舟云学术

Organic surface analysis with time-of-flight SIMS

Published:1990-01 Issue:1-6 Volume:101 Page:3-18
ISSN:0026-3672
Container-title:Microchimica Acta
language:en
Short-container-title:Mikrochim Acta

Author:

van der Wel Hans,Lub Johan,van Velzen Peter N. T.,Benninghoven Alfred

Publisher

Springer Science and Business Media LLC

Subject

Analytical Chemistry

Link

http://link.springer.com/content/pdf/10.1007/BF01244153.pdf

Reference63 articles.

1. D. Briggs, M. P. Seah (eds.),Practical Surface Analysis by Auger and X-Ray Photoelectron Spectroscopy, Wiley, Chichester, 1983.

2. A. M. Bradshaw, E. Schweizer, in:Spectroscopy of Surfaces (Adv. Spectrosc., Vol. 16), (R. J. H. Clark, R. E. Hester, eds.), Wiley, Chichester, 1988, p. 413.

3. R. K. Chang, T. E. Furtak (eds.),Surface Enhanced Raman Scattering, Plenum, New York, 1982.

4. P. K. Hansma (ed.),Tunneling Spectroscopy: Capabilities, Applications and New Techniques, Plenum, New York, 1982.

5. A. Benninghoven, H. W. Werner, F. G. R�denauer (eds.),Secondary Ion Mass Specrometry, Wiley-Interscience, New York, 1987.

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