Quantitative characterization of the three-dimensional microstructure of polycrystalline Al-Sn using X-ray microtomography

Author:

Döbrich K. M.,Rau C.,Krill C. E.

Publisher

Springer Science and Business Media LLC

Subject

Metals and Alloys,Mechanics of Materials,Condensed Matter Physics

Reference66 articles.

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2. R.T. DeHoff: J. Microsc., 1983, vol. 131, pp. 259–63.

3. D. Brandon and W.D. Kaplan: Microstructural Characterization of Materials, Wiley, Chichester, 1999.

4. F.N. Rhines, K.R. Craig, and D.A. Rousse: Metall. Trans. A, 1976, vol. 7A, pp. 1729–34.

5. M. Li, S. Ghosh, T.N. Rouns, H. Weiland, O. Richmond, and W. Hunt: Mater. Characterization, 1998, vol. 41, pp. 81–95.

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