Measuring Stress Distributions in Ti-6Al-4V Using Synchrotron X-Ray Diffraction-Reference-Cited by-同舟云学术

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Measuring Stress Distributions in Ti-6Al-4V Using Synchrotron X-Ray Diffraction

Published:2008-10-15 Issue:13 Volume:39 Page:3120-3133
ISSN:1073-5623
Container-title:Metallurgical and Materials Transactions A
language:en
Short-container-title:Metall Mater Trans A

Author:

Bernier J.V.,Park J.-S.,Pilchak A.L.,Glavicic M.G.,Miller M.P.

Publisher

Springer Science and Business Media LLC

Subject

Metals and Alloys,Mechanics of Materials,Condensed Matter Physics

Link

https://link.springer.com/content/pdf/10.1007/s11661-008-9639-6.pdf

Reference30 articles.

1. A.M. Korsunsky, K.E. Wells, and P.J. Withers: Scripta Metall., 1998, vol. 39, pp. 1705–12

2. A. Wanner, and D. Dunand: Metall. Mater. Trans. A, 2000, vol. 31A, pp. 2949–62

3. M.P. Miller, J.V. Bernier, J.-S. Park, and A. Kazimirov: Rev. Sci. Instrum., 2005, vol. 76, p. 113903

4. S.F. Nielsen, A. Wolf, H.F. Poulsen, M. Ohler, U. Lienert, and R.A. Owen: J. Synchrotron Rad., 2000, vol. 7, pp. 103–09

5. E.M. Lauridsen, D. Juul Jensen, H.F. Poulsen, and U. Lienert: Scripta Mater., 2000, vol. 43, pp. 561–66

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