Author:
Wojewoda-Budka J.,Wierzbicka-Miernik A.,Litynska-Dobrzynska L.,Korneva A.,Kodentsov A.
Abstract
AbstractThe composition and crystal structure of the constituents of the periodic layered microstructure developed during the solid-state reaction between Co2Si intermetallic and zinc at 390 °C were investigated using scanning electron microscopy, transmission electron microscopy, and electron-probe microanalysis. It was demonstrated that the periodic layered morphology generated in the reaction zone of the Co2Si/Zn diffusion couples consists of bands of in situ-formed precipitates of cubic CoSi intermetallic, embedded in a continuous matrix of Co-Zn-based hexagonal phase containing a small amount of silicon. It was suggested that the formation of the hexagonal intermetallic of the same crystal structure as the binary δ phase of the Co-Zn system can be attributed to the possible stabilizing effect of silicon: the δ-phase structure becomes stable in the ternary Co-Si-Zn system at 390 °C.
Publisher
Springer Science and Business Media LLC
Subject
Metals and Alloys,Mechanics of Materials,Condensed Matter Physics
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