Characterization of Vacancy Defects Using TEM in Heavy-Ion-Irradiated Tungsten Foils

Abstract

AbstractThe nature and type of defects formed due to heavy-ion irradiation in tungsten foils are analyzed using transmission electron microscopy. The recrystallized tungsten foils were irradiated by 80 MeV gold ions at room temperature for a fluence of 1.3 $$\times $$ ×  10$$^{14}$$ 14  ions/cm$$^2$$ 2 that amounts to a net displacement per atom (dpa) of 0.22. The defect structures were analyzed using bright-field and weak-beam dark field imaging at two different depths to understand the depth profile of the defects. It is found that the defect clusters formed during the irradiation, both at the near-surface and at 2 $$\mu $$ μ m depth are of vacancy type that is confirmed by the local strain analysis and supports the findings of vacancy clusters in positron lifetime measurements. The analysis also shows that the dislocation-lines were of pure edge, pure screw and mixed. The fraction of mixed dislocation is found to increase during irradiation at the expense of pure edge and screw dislocations.