Possibilistic Worst Case Distance and Applications to Circuit Sizing-Reference-Cited by-同舟云学术

Possibilistic Worst Case Distance and Applications to Circuit Sizing

Published: Issue: Volume: Page:287-295
ISSN:
Container-title:Advances in Soft Computing
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Author:

Sciacca Eva,Spinella Salvatore,Anile Angelo Marcello

Publisher

Springer Berlin Heidelberg

Link

http://link.springer.com/content/pdf/10.1007/978-3-540-72434-6_29.pdf

Reference14 articles.

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2. Hjamlmarson, E.: Studies on design automation of analog circuits - the design flow. PhD thesis, Department of Electrical Engineering. Linlköpings universitet, Linlköpings, Sweden (2003)

3. Zadeh, L.A.: Fuzzy algorithms. Information and Control 12(2), 94–102 (1968)

4. Antreich, K., Graeb, H., Wieser, C.: Practical methods for worst-case and yield analysis of analog integrated circuits. International Journal of High Speed Electronics and Systems 4(3), 261–282 (1993)

5. Graeb, H., Wieser, C., Antreich, K.: Improved methods for worst-case analysis and optimization incorporating operating tolerances, pp. 142–147 (1993)

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