Author:
DiCicco D.,Meixler L.,Skinner C. H.,Suckewer S.,Hirschberg J.,Kohen E.
Publisher
Springer Berlin Heidelberg
Reference5 articles.
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2. R. Feder, J.W. McGowan, and D. Shinozaki: Examining the Submicron World, Plenum Publishing Company, (1986).
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4. G. Schmahl and D. Rudolph: X-Ray Microscopy, Proceedings of the International Symposium, Gottingen, Federal Republic of Germany, Sept. 14–16, 1983, Springer Series in Optical Science 43, Springer Verlag 1984.
5. E. Spiller: High Resolution Soft X-Ray Optics, Proceedings of the SPIE, Brookhaven, New York, Nov. 18–20, 1981, SPIE 316, 1981.
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