The Optical Constants of Materials at Soft X-Ray Wavelengths

Author:

Michette A. G.,Kühne M.

Publisher

Springer Berlin Heidelberg

Reference5 articles.

1. C J Buckley, M T Browne and P Charalambous Proc. SPIE 537 213–7 (1985)

2. A G Michette, C J Buckley, M Kühne and P Müller, these proceedings.

3. A G Michette and M Kühne Proc. Int. Symp. Short Wavelength Lasers and their Applications, Samarkand 1990 (Nova Science Publishers, New York) (in press, 1990)

4. B L Henke, E M Gullikson, J C Davis, M Fryer and A Oren Proc. SPIE 911 107–21 (1988)

5. P Charalambous, Ph.D Thesis, London University (1982).

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1. Development of XANES nanoscopy on BL7C at PLS-II;Journal of Synchrotron Radiation;2020-02-20

2. Determination of X-ray indices of refraction by interferometry;Physics of X-Ray Multilayer Structures;1994

3. Soft-x-ray interferometer for measuring the refractive index of materials;Optics Letters;1993-08-15

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