Scanning Probe Microscopy – Principle of Operation, Instrumentation, and Probes
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Publisher
Springer Berlin Heidelberg
Link
http://link.springer.com/content/pdf/10.1007/978-3-540-29857-1_22.pdf
Reference167 articles.
1. G. Binnig, H. Rohrer, Ch. Gerber, E. Weibel: Surface studies by scanning tunneling microscopy, Phys. Rev. Lett. 49, 57–61 (1982)
2. G. Binnig, C. F. Quate, Ch. Gerber: Atomic force microscope, Phys. Rev. Lett. 56, 930–933 (1986)
3. G. Binnig, Ch. Gerber, E. Stoll, T. R. Albrecht, C. F. Quate: Atomic resolution with atomic force microscope, Europhys. Lett. 3, 1281–1286 (1987)
4. B. Bhushan: Handbook of Micro/Nanotribology, 2nd edn. (CRC, Boca Raton 1999)
5. C. M. Mate, G. M. McClelland, R. Erlandsson, S. Chiang: Atomic-scale friction of a tungsten tip on a graphite surface, Phys. Rev. Lett. 59, 1942–1945 (1987)
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