Author:
Pasternak Benny,Tyszberowicz Shmuel,Yehudai Amiram
Publisher
Springer Berlin Heidelberg
Cited by
2 articles.
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1. A catalogue of stub and driver patterns to support integration testing of aspect-oriented programs;Proceedings of the 8th Latin American Conference on Pattern Languages of Programs - SugarLoafPLoP '10;2010
2. GenUTest: a unit test and mock aspect generation tool;International Journal on Software Tools for Technology Transfer;2009-09-03