Irradiation effects in semiconductor
Author:
Publisher
Springer Science and Business Media LLC
Subject
Mechanics of Materials,General Materials Science
Link
http://link.springer.com/content/pdf/10.1007/BF02744746.pdf
Reference7 articles.
1. Asgekar V B, Bhalla R K, Raye B S, Bhiday M R and Bhoraskar V N 1980Pramana — J. Phys. 15 479
2. Hansen P, Heitmann H and Smit P H 1982Phys. Rev. B29 3539
3. Padgaonkár S, Dhole S D and Bhoraskar V N 1991J. Phys. D24 702
4. Railkar T A, Bhide R S, Bhoraskar S V, Manorama V and Rao V J 1992J. Appl. Phys. 72 155
5. Railkar T A, Bhoraskar S V, Dhole S D and Bhoraskar V N 1993J. Appl. Phys. 74 4343
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