X-ray study of the wetting behaviour of CCl4 on Si/SiO2 surfaces-Reference-Cited by-同舟云学术

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X-ray study of the wetting behaviour of CCl4 on Si/SiO2 surfaces

Published:1994-09 Issue:3 Volume:95 Page:331-339
ISSN:0722-3277
Container-title:Zeitschrift f�r Physik B Condensed Matter
language:en
Short-container-title:Z. Physik B - Condensed Matter

Author:

M�ller-Buschbaum P.,Tolan M.,Press W.

Publisher

Springer Science and Business Media LLC

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,General Materials Science

Link

http://link.springer.com/article/10.1007/BF01343962/fulltext.html

Reference52 articles.

1. de Gennes, P.G.: Rev. Mod. Phys.57, 827 (1985)

2. Drir, M., Nham, H.S., Hess, G.B.: Phys. Rev. B33, 5145 (1986)

3. Nham, H.S., Drir, M., Hess, G.B.: Phys. Rev. B35, 3675 (1986)

4. Volkmann, U.G., Knorr, K.: Surf. Sci.221, 379 (1989)

5. Volkmann, U.G., Knorr, K.: Phys. Rev. Lett.66, 473 (1991)

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