Effect of emission center density on the rate of degradation processes in thin-film MIM cathodes-Reference-Cited by-同舟云学术

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Effect of emission center density on the rate of degradation processes in thin-film MIM cathodes

Published:1992-06 Issue:6 Volume:35 Page:569-571
ISSN:1064-8887
Container-title:Russian Physics Journal
language:en
Short-container-title:Russ Phys J

Author:

Gaponenko V. M.,Motoshkin V. V.

Publisher

Springer Science and Business Media LLC

Subject

General Physics and Astronomy

Link

http://link.springer.com/content/pdf/10.1007/BF00559185.pdf

Reference16 articles.

1. D. Dearnaley, A. M. Stoneham, and D. V. Morgan, Usp. Fiz. Nauk,112, 83?128 (1974).

2. Yu. A. Burachevskii, Zh. Tekh. Fiz.,51, 1311?1313 (1981).

3. G. A. Vorob'ev, R. B. Lubsanov, and P. E. Troyan, Radiotekh. Élektron.,30, 1380?1383 (1985).

4. G. A. Vorob'ev and V. M. Gaponenko, Izv. Vyssh. Uchebn. Zaved., Fiz., No. 1, 65?67 (1991).

5. V. M. Gaponenko, Izv. Vyssh. Uchebn. Zaved., Fiz., No. 10, 94?98 (1991).

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