Author:
Yin Yi-Xiao,Chen Yun-Ji,Guo Qi,Chen Tian-Shi
Publisher
Springer Science and Business Media LLC
Subject
Computational Theory and Mathematics,Computer Science Applications,Hardware and Architecture,Theoretical Computer Science,Software
Reference39 articles.
1. Baumann R. Radiation-induced soft errors in advanced semi- conductor technologies. IEEE Transactions on Device and Materials Reliability, 2005, 5(3): 305-316.
2. Mukherjee S S, Weaver C, Emer J, et al. A systematic methodology to compute the architectural vulnerability factors for a high-performance microprocessor. In Proc. the 36th Annual IEEE/ACM International Symposium on Microarchitecture (MICRO2003), December 2003, p.29.
3. Shivakumar P, Kistler M, Keckler S et al. Modeling the effect of technology trends on the soft error rate of combinational logic. In Proc. the International Conference on Dependable Systems and Networks (DSN2002), June 2002, pp.389-398.
4. Mitra S, Seifert N, Zhang M, Shi Q et al. Robust system design with built-in soft-error resilience. IEEE Computer, 2005, 38(2): 43-52.
5. Lyons R E, Vanderkulk W. The use of triple-modular redundancy to improve computer reliability. IBM Journal of Research and Development, 1962, 6(2): 200-209.
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献