Author:
Bolchini C.,Miele A.,Rebaudengo M.,Salice F.,Sciuto D.,Sterpone L.,Violante M.
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Cited by
7 articles.
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1. SEU Evaluation of Hardened-by-Replication Software in RISC- V Soft Processor;2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2021-10-06
2. Detecting Single Event Upsets in Embedded Software;2018 IEEE 21st International Symposium on Real-Time Distributed Computing (ISORC);2018-05
3. Radiative Effects on MRAM-Based Non-Volatile Elementary Structures;2015 IEEE Computer Society Annual Symposium on VLSI;2015-07
4. Two control-flow error recovery methods for multithreaded programs running on multi-core processors;Facta universitatis - series: Electronics and Energetics;2015
5. ANB- and ANBDmem-Encoding: Detecting Hardware Errors in Software;Lecture Notes in Computer Science;2010