Funder
National Youth Natural Science Foundation of China
National Natural Science Foundation of China
Natural Science Youth Foundation in Jiangsu Province
Youth Science and Technology Innovation Fund of Nanjing Agricultural University
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Reference28 articles.
1. Aminian F, Aminian M, Collins HW (2002) Analog fault diagnosis of actual circuits using neural networks. IEEE Trans Instrum Meas 51(3):544–550
2. Augusto JS, Almeida C (2006) A tool for test point selection and single fault diagnosis in linear analog circuits. In Proceeding XXI International Conference on Design of Systems and Integrated Systems, Barcelona, Spain
3. Fedi G, Manetti S, Piccirilli MC, Starzyk J (1999) Determination of an optimum set of testable components in the fault diagnosis of analog linear circuits. IEEE Trans Circuits Syst 46(7):779–787
4. Golonek T, Rutkowski J (2007) Genetic-algorithm- based method for optimal analog test points selection. IEEE Trans Circuits Syst Express Briefs 54(2):117–121
5. Hochwald W, Bastian JD (1979) A DC approach for analog fault dictionary determination. IEEE Trans Circuits Syst 26:523–529
Cited by
8 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献