Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Supply Gating Technique-Reference-Cited by-同舟云学术

Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Supply Gating Technique

Published:2008-06-24 Issue:6 Volume:24 Page:577-590
ISSN:0923-8174
Container-title:Journal of Electronic Testing
language:en
Short-container-title:J Electron Test

Author:

Bhunia Swarup,Mahmoodi Hamid,Raychowdhury Arijit,Roy Kaushik

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering

Link

http://link.springer.com/content/pdf/10.1007/s10836-008-5072-4.pdf

Reference24 articles.

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3. Bushnell ML, Agrawal VD (2000) Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits. Kluwer, Boston

4. Calhoun BH, Honore FA, Chandrakasan A (2003) Design methodology for fine-grained leakage control in MTCMOS. In: International symposium on low power electronics design, Seoul, pp 104–107, 25–27 August

5. Cheng K-T, Devadas S, Keutzer K (1991) A partial en- hanced scan approach to robust delay-fault test generation for sequential circuits. In: International test conference, Nashville, pp 403–410, 26–30 October

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