Evaluation of the Impact of Technology Scaling on Delay Testing for Low-Cost AVS
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
http://link.springer.com/content/pdf/10.1007/s10836-019-05797-w.pdf
Reference22 articles.
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3. Burd TD, et al. (2000) A dynamic voltage scaled microprocessor system. In: Proceedings of the IEEE international solid-state circuits conference (ISSCC), pp 294–295
4. Chan T, Kahng AB (2012) Tunable sensors for process-aware voltage scaling. In: Proceedings of the IEEE/ACM international conference on computer aided design (ICCAD), pp 7–14
5. Chan T et al (2012) DDRO: a novel performance monitoring methodology based on design-dependent ring oscillators. In: Proceedings of the IEEE international symposium on quality electronic design (ISQED), pp 633–640
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