Design and Optimization Methodology of Coplanar Waveguide Test Structures for Dielectric Characterization of Thin Films
Author:
Funder
National Science Foundation
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
http://link.springer.com/content/pdf/10.1007/s10836-020-05873-6.pdf
Reference13 articles.
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3. Eisenstadt WR, Eo Y (1992) S-parameter-based IC interconnect transmission line characterization. IEEE Transactions on Components, Hybrids, and Manufacturing Technology 15(4):483–490
4. K. C. Gupta (1998) Microstrip Lines and Slotlines. 2nd edition. Boston, MA: Artech House, ch 7.
5. Holloway CL, Kuester EF (1995) A quasi-closed form expression for the conductor loss of CPW lines, with an investigation of edge shape effects. IEEE Transactions on Microwave Theory and Techniques 43(12):2695–2701
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