Author:
Romero Edgar Leonardo,Strum Marius,Chau Wang Jiang
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Reference28 articles.
1. Asaf S, Marcus E, Ziv A (2004) Defining coverage views to improve functional coverage analysis. In: Proceeedings of IEEE Design Automation Conference, pp 41–44
2. Bartlett J, Kotrlik J, Higgins C (2001) Organizational research: determining appropriate sample size in survey research. Information Technology, Learning, and Performance Journal 19:43–50
3. Bergeron J (2003) Writing testbenches: functional verification of HDL models, 2nd edn. Kluwer, Boston
4. Bramer M (2007) Principles of data mining. Springer, London
5. Braun M, Rosenstiel W, Schubert K (2003) Comparison of Bayesian networks and data mining for coverage directed verification. In: Proceedings of High Level Design Verification and Test Workshop, pp 91–95
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献