Using Distortion Shaping Technique to Equalize ADC THD Performance Between ATEs-Reference-Cited by-同舟云学术

Using Distortion Shaping Technique to Equalize ADC THD Performance Between ATEs

Published:2016-12-15 Issue:3 Volume:33 Page:295-303
ISSN:0923-8174
Container-title:Journal of Electronic Testing
language:en
Short-container-title:J Electron Test

Author:

Sarson Peter^ORCID,Kobayashi Haruo

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering

Link

http://link.springer.com/content/pdf/10.1007/s10836-016-5630-0.pdf

Reference12 articles.

1. Abe F, Kobayashi Y, Sawada K, Kato K, Kobayashi O, Kobayashi H (2014) Low-distortion signal generation for ADC testing. IEEE International Test Conference, Seattle

2. Barragan MJ, Leger G, Vazquez D, Rueda A (2015) On-chip sinusoidal signal generation with harmonic cancelation for analog and mixed-signal BIST applications. Analog Integrated Circuit and Signal Processing 82(1):67–79

3. Dufort B, Roberts GW (2013) On-chip analog signal generation for mixed-signal built-in self-test. IEEE J Solid State Circuits 34(3):318–330

4. Elsayed MM, Sanchez-Sinencio E (2010) A low THD, low power, high output-swing time-mode-based tunable oscillator via digital harmonic-cancellation technique. IEEE J Solid State Circuits 45(5):1061–1071

5. Karthik VB, Sudani SK, Chen DJ, Geiger RL (2013) Low-distortion sine wave generation using a novel harmonic cancellation technique. IEEE Transactions on Circuits and Systems I: Regular Papers 60(5):1122–1134

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