1. Bing L, Shulin T, Houjun W (2007) Modified diagnosis algorithms based on multisignal model and application in circuit boards; Communications, circuits and systems. ICCCAS 2007. International Conference on; 11–13 July 2007:1168–1171
2. Chakrabarty S, Rajan V, Ying J, Mansjur M, Pattipati K, Deb S (1998) A virtual test-bench for analog circuit testability analysis and fault diagnosis; AUTOTESTCON ′98. IEEE Systems Readiness Technology Conference. IEEE 24–27 Aug. 1998: 337–352
3. Deb S, Ghoshal S, Mathur A, Shrestha R, Pattipati KR (1998) Multisignal modeling for diagnosis, FMECA, and reliability; Systems, Man, and Cybernetics. 1998 IEEE International Conference on; Volume 3, 11–14 Oct. 1998:3026–3031
4. Deb S, Pattipati KR, Raghavan V, Shakeri M, Shrestha R (1994) Multi-signal flow graphs: a novel approach for system testability analysis and fault diagnosis AUTOTESTCON ′94. IEEE Systems Readiness Technology Conference. ‘Cost Effective Support Into the Next Century’, Conference Proceedings.20-22 Sept.:361–373
5. Deb S, Pattipati KR, Raghavan V, Shakeri M, Shrestha R (1995) Multi-signal flow graphs: a novel approach for system testability analysis and fault diagnosis. Aero Electron Syst Mag IEEE 10(5):14–25