1. Anonymous (2003) IEEE Standard for boundary-scan testing of advanced digital networks. IEEE Std 1149.6-2003 0_1-132
2. Anonymous (2010) IEEE Standard for reduced-pin and enhanced-functionality test access port and boundary-scan architecture. IEEE Std 1149.7-2009 c1-985
3. Anonymous (2011) IEEE standard for a mixed-signal test bus. IEEE Std 1149.4-2010 (Revision of IEEE Std 1149.4-1999) 1-116
4. Anonymous (2012) IEEE Draft standard for boundary-scan-based stimulus of interconnections to passive and/or active components. IEEE P1149.8.1/D5.2, November 2011 1-91
5. da Silva JM, Laramjeira LC, Matos JS (1999) A method for testing analog clusters using IEEE P1149.4. 125-126