Author:
Wang Zhanglei,Chakrabarty Krishnendu
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Reference26 articles.
1. M. Abramovici, E. Lee, and C. Stroud, “BIST-based Diagnostics for FPGA Logic Blocks,” Proc.—International Test Conference, 1997, pp. 539–547.
2. J.G. Brown and R.D.S. Blanton, “CAEN–BIST: Testing the Nanofabric,” Proc.—International Test Conference, 2004, pp. 462–471.
3. M. Butts, A. DeHon, and S.C. Goldstein, “Molecular Electronics: Devices, Systems and Tools for Gigagate, Gigabit Chips,” Proc. International Conference on Computer-aided Design, 2002, pp. 433–440.
4. Y. Chen, G.-Y. Jung, D.A.A. Ohlberg, X. Li, D.R. Stewart, J.O. Jeppesen, K.A. Nielsen, J.F. Stoddart, and R. StanleyWilliams, “Nanoscale Molecular-switch Crossbar Circuits,” Nanotechnology, vol. 14, pp. 462–468, Mar. 2003.
5. W.B. Culbertson, R. Amerson, R.J. Carter, P. Kuekes, and G. Snider, “Defect Tolerance on the Teramac Custom Computer,” Proc. IEEE Symposium on Field-programmable Custom Computing Machines, 1997, pp. 116–223.
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