Analog Circuits Fault Detection Using Cross-Entropy Approach
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
http://link.springer.com/content/pdf/10.1007/s10836-012-5344-x.pdf
Reference18 articles.
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3. Butcher S, Sheppard J (2009) Distributional smoothing in bayesian fault diagnosis. IEEE Trans Instrum Meas 58(2):342–349
4. Deng Y, Shi Y, Zhang W (2011) An approach to locate parametric faults in nonlinear analog circuits. IEEE Trans Instrum Meas 61(2):358–367
5. Iuculano G, Nielsen L, Zanobini A, Pellegrini G (2007) The principle of maximum entropy applied in the evaluation of the measurement uncertainty. IEEE Trans Instrum Meas 56(3):717–722
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