Multi-Threaded Mitigation of Radiation-Induced Soft Errors in Bare-Metal Embedded Systems-Reference-Cited by-同舟云学术

Multi-Threaded Mitigation of Radiation-Induced Soft Errors in Bare-Metal Embedded Systems

Published:2019-12-19 Issue:1 Volume:36 Page:47-57
ISSN:0923-8174
Container-title:Journal of Electronic Testing
language:en
Short-container-title:J Electron Test

Author:

Serrano-Cases Alejandro,Restrepo-Calle Felipe,Cuenca-Asensi Sergio,Martínez-Álvarez Antonio^ORCID

Publisher

Springer Science and Business Media LLC

Subject

Electrical and Electronic Engineering

Link

http://link.springer.com/content/pdf/10.1007/s10836-019-05846-4.pdf

Reference28 articles.

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3. Baumann R (2005) Radiation-induced soft errors in advanced semiconductor technologies. IEEE Trans Dev Mater Reliab 5:305–316

4. Iturbe X, Venu B, Ozer E, Das S (2016) A triple core lock-step (TCLS) ARM®

5. cortex®;-R5 processor for safety-critical and ultra-reliable applications. In: Proc. 2016 46th Annual IEEE/IFIP international conference on dependable systems and networks workshop (DSN-W). IEEE, pp 246-249

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