A Low-Cost Test Methodology for Dynamic Specification Testing of High-Speed Data Converters
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
http://link.springer.com/content/pdf/10.1007/s10836-006-9523-5.pdf
Reference28 articles.
1. K. Arabi, B. Kaminska, and M. Sawan, “On-Chip Test Data Converters Using Static Parameters,” IEEE Trans. Very Large Scale Integration (VLSI) Systems, vol. 6, no. 3, pp. 409–419, Sept. 1998.
2. B.N.S. Babu and H.B. Wollman, “Testing an ADC Linearized with Pseudorandom Dither,” IEEE Trans. Instrumentation and Measurement, vol. 47, no. 4, pp. 839–848, Aug. 1997.
3. S. Bhattacharya, et al., “System-Level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams,” Proc. VLSI Test Symposium, pp. 229–234, Apr. 2004.
4. G. Chiorboli, “Sub-Picosecond Aperture-Uncertainty Measurements,” IEEE Trans. on Instrumentation and Measurement, vol. 51, no. 5, pp. 1039–1044, Oct. 2002.
5. J.H. Friedman, “Multivariate Adaptive Regression Splines,” The Annals of Statistics, vol. 19, no. 1, pp. 1–141, 1991.
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