Author:
Guarnieri Valerio,Di Guglielmo Giuseppe,Bombieri Nicola,Pravadelli Graziano,Fummi Franco,Hantson Hanno,Raik Jaan,Jenihhin Maksim,Ubar Raimund
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Reference35 articles.
1. Abramovici M, Breuer M, Friedman A (1990) Digital systems testing and testable design. Computer Science Press, New York
2. Agrawal H, DeMillo RA, Hathaway B, Hsu W, Hsu W, Krauser EW, Martin RJ, Mathur AP, Spafford E (1989) Design of mutant operators for the C programming language. Purdue University, West Lafayette, Indiana, techreport SERC-TR-41-P
3. Alexander RT, Bieman JM, Ghosh S, Bixia J (2002) Mutation of Java objects. In: Proc. of IEEE ISSRE, pp 341–351
4. Belli F, Budnik C-J, Wong W-E (2006) Basic operations for generating behavioral mutants. In: Proc. of IEEE ISSRE, pp 10–18
5. Bombieri N, Fummi F, Pravadelli G (2006) On the evaluation of transactor-based verification for reusing TLM assertions and testbenches at RTL. In: Proc. of ACM/IEEE conference on design, automation and test in Europe, DATE, pp 1007–1012
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献