Fast PWM-Based Test for High Resolution ΣΔ ADCs
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
http://link.springer.com/content/pdf/10.1007/s10836-007-5047-x.pdf
Reference15 articles.
1. International Technology Roadmap for Semiconductors (2003) available online: http://public.itrs.net
2. Provost B, Sanchez-Sinecio E (2003) On-chip ramp generators for mixed-signal BIST and ADC self-test. IEEE J Solid-State Circuits 38(2):263–273 (Feb)
3. Kuyel T (1999) Linearity testing issues of analog-to-digital converters. In: Proceedings of the International Test Conference 1999, pp 747–756 (Sept)
4. Frisch A, Almy T (1997) HABIST: histogram-based analog built in self test, IEEE International Test Conference, ITC97, 3–5th Nov. Washington, DC, USA, pp 760–767
5. Toner M, Roberts G (1993) A BIST scheme for an SNR test of a Sigma Delta ADC. In: International Test Conference, Baltimore, MD, October 1993, pp. 805-814
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