Author:
Jeffrey C.,Cutajar R.,Richardson A.,Prosser S.,Lickess M.,Riches S.
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Reference20 articles.
1. British Standard Institute, BS5760, “Reliability of Systems, Equipment and Components,” Part 5: “Guide to Failure Modes, Effects and Criticality Analysis (FMEA and FMECA),” 1991.
2. J.J. Camargo Jr., E. Canzin, J.R. Almeida Jr., S.M. Paz, and B.A. Basseto, “Quantitative Analysis Methodology in Safety-Critical Microprocessor Applications,” Reliability Engineering and System Safety, vol. 74, pp. 53–62, 2001.
3. E. Dilger, R. Karrelmeyer, and B. Straube, “Fault Tolerant Mechatronics,” in 10th IEEE International Online Testing Symposium, 2004, pp. 214–218.
4. G.O. Ducoucdray and A.J. Ramirez-Angulo, “Innovative Built-In Self-Test Schemes for On-Chip Diagnosis, Compliant with IEEE1149.4 Mixed Signal Test Bus Standard,” Journal of Electronic Testing, vol. 19, pp. 21–28, 2003.
5. I. Duzevik, “Preliminary Results of Passive Component Measurement Methods Using and IEEE1149.4 Compliant Device,” http://www.national.com/appinfo/scan/files/duzevik_BTW02_paper.pdf.
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