Author:
Brown Jason G.,Blanton R. D.
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Reference40 articles.
1. M. Abramovici, M.A. Breuer, and A.D. Friedman, Digital Systems Testing and Testable Design, Piscataway, NJ: IEEE, 1990.
2. J.G. Brown and R.D. Blanton, “CAEN–BIST: Testing the NanoFabric,” in International Test Conference, Oct. 2004, pp. 462–471.
3. M. Butts, A. DeHon, and S.C. Goldstein, “Molecular Electronics: Devices, Systems and Tools for Gigagate, Gigabit Chip,” in Proceedings of International Conference on Computer Aided Design, 2002, pp. 443–440.
4. C.P. Collier et al., “Electronically Configurable Molecular-based Logic Gates,” Science, vol. 285, pp. 391–394, July 1999.
5. Y. Cui et al., “Diameter-controlled Synthesis of Single Crystal Silicon Nanowires,” Appl. Phys. Lett., vol. 78, pp. 2214–2216, 2001.
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