Leakage-Aware Droop Measurement Built-in Self-Test Circuit for Digital Low-Dropout Regulators
Author:
Publisher
Springer Science and Business Media LLC
Subject
Electrical and Electronic Engineering
Link
http://link.springer.com/article/10.1007/s10836-018-5744-7/fulltext.html
Reference21 articles.
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2. Burton EA, Schrom G, Paillet F, Douglas J, Lambert WJ, Radhakrishnan K, Hill MJ (2014) FIVR — Fully integrated voltage regulators on 4th generation Intel®; CoreTM SoCs. In: Proc. IEEE Applied Power Electronics Conference and Exposition (APEC), pp 432–439. https://doi.org/10.1109/APEC.2014.6803344
3. Chow HC, Hor ZH (2008) A high performance peak detector sample and hold circuit for detecting power supply noise. In: Proc. IEEE Asia Pacific Conference on Circuits and Systems (APCCAS), pp 672–675. https://doi.org/10.1109/APCCAS.2008.4746113
4. Dirican A, Ozmen C, Margala M (2018) A droop measurement built-in self-test circuit for digital low-dropout regulators. In: Proc. 19th International Symposium on Quality Electronic Design (ISQED), pp 8–13. https://doi.org/10.1109/ISQED.2018.8357257
5. Huang M, Lu Y, Sin SW, SP U, Martins RP (2016a) A fully integrated digital LDO with coarse–fine-tuning and burst-mode operation. IEEE Trans Circuits Syst II, Express Briefs 63(7):683–687. https://doi.org/10.1109/TCSII.2016.2530094
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